S.H. Baek, J. Park, D.M. Kim, V.A. Aksyuk, R.R. Das, S.D. Bu, D.A. Felker, J. Lettieri, V. Vaithyanathan, S.S.N. Bharadwaja, N. Bassiri-Gharb, Y.B. Chen, H.P. Sun, C.M. Folkman, H.W. Jang, D.J. Kreft, S.K. Streiffer, R. Ramesh, X.Q. Pan, S. Trolier-McKinstry, D.G. Schlom, M.S. Rzchowski, R.H. Blick, and C.B. Eom, “Giant Piezoelectricity on Si for Hyperactive MEMS,” Science 334 (2011) 958-961.
Integrating Functional Oxides with Semiconductors Publications
M. Belmeguenai, S. Mercone, C. Adamo, T. Chauveau, L. Méchin, P. Monod, P. Moch, and D.G. Schlom, “La0.7Sr0.3MnO3 Thin Films on SrTiO3 and CaTiO3 Buffered Si Substrates: Structural, Static, and Dynamic Magnetic Properties,” Journal of Nanoparticle Research 13 (2011) 5669-5675.
M. Belmeguenai, S. Mercone, C. Adamo, P. Moch, D.G. Schlom, and P. Monod, “Structural and Magnetic Properties of La0.7Sr0.3MnO3 Thin Films Integrated onto Si(100) Substrates with SrTiO3 as Buffer Layer,” Journal of Applied Physics 109 (2011) 07C120-1 – 07C120-3.
X. Weng, W. Tian, D.G. Schlom, and E.C. Dickey, “Structure and Chemistry of the (111)Sc2O3/(0001) GaN Epitaxial Interface,” Applied Physics Letters 96 (2010) 241901-1 – 241901-3.
M. Belmeguenai, S. Mercone, C. Adamo, L. Méchin, C. Fur, P. Monod, P. Moch, and D.G. Schlom, “Temperature Dependence of Magnetic Properties of La0.7Sr0.3MnO3/SrTiO3 Thin Films on Silicon Substrates,” Physical Review B 81 (2010) 054410-1 – 054410-8.
J.F. Ihlefeld, W. Tian, Z.K. Liu, W.A. Doolittle, M. Bernhagen, P. Reiche, R. Uecker, R. Ramesh, and D.G. Schlom, “Adsorption-Controlled Growth of BiFeO3 by MBE and Integration with Wide Band Gap Semiconductors,” IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control 56 (2009) 1528-1533.
M.P. Warusawithana, C. Cen, C.R. Sleasman, J.C. Woicik, Y.L. Li, L.F. Kourkoutis, J.A. Klug, H. Li, P. Ryan, L-P. Wang, M. Bedzyk, D.A. Muller, L.Q. Chen, J. Levy, and D.G. Schlom, “A Ferroelectric Oxide Made Directly on Silicon,” Science 324 (2009) 367-370.
S.B. Mi, C.L. Jia, V. Vaithyanathan, L. Houben, J. Schubert, D.G. Schlom, and K. Urban, “Atomic Structure of the Interface between SrTiO3 Thin Films and Si(001) Substrates,” Applied Physics Letters 93 (2008) 101913-1 – 101913-3.
Y.H. Chu, Q. Zhan, C‑H. Yang, M.P. Cruz, L.W. Martin, T. Zhao, P. Yu, R. Ramesh, P.T. Joseph, I.N. Lin, W. Tian, and D.G. Schlom, “Low Voltage Performance of Epitaxial BiFeO3 Films on Si Substrates through Lanthanum Substitution,” Applied Physics Letters 92 (2008) 102909-1 – 102909-3.
L.F. Kourkoutis, C.S. Hellberg, V. Vaithyanathan, H. Li, M.K. Parker, K.E. Andersen, D.G. Schlom, and D.A. Muller, “Imaging the Phase Separation in Atomically Thin Buried SrTiO3 Layers by Electron Channeling,” Physical Review Letters 100 (2008) 036101-1 – 036101-4.